This course introduces the physical and physico-chemical principles of surface analysis foundations as well as their functioning principles. Application examples in various domains of materials science are presented. Particular attention is being paid on the specific information each technique may provide and on their advantages and drawbacks.
Course content
- Introduction to surface science.
- Electronic spectroscopies: LEED, AES, XPS.
- Ionic spectroscopies: ISS, RBS, SIMS.
- Ionic pulverisation for depth profiling.
- Scanning probe micorsocpies: STM, AFM, ...
- Teacher: Delcorte Arnaud
- Teacher: Eloy Pierre
- Teacher: Nysten Bernard
- Teacher: Poleunis Claude